SWTW 2006 - Call for Participation

CALL FOR PARTICIPATION

Workshop Overview -- Program Highlights -- Hotel Information

Workshop Overview

The 16th annual SWTW is the only conference that focuses on all aspects of semiconductor wafer and die level probe testing. It begins Sunday afternoon with a welcome reception, tabletop exhibit viewing, dinner, and a Keynote Speaker. The technical program begins Monday morning with 30-minute presentations in theme-oriented sessions. Advanced registration is $515 for IEEE members and $645 for non-members, and it includes all meals and social activities, conference and exhibit attendance, and the printed Proceedings. The conference concludes Wednesday after the awards luncheon. To receive the advanced registration discount, register online at:

www.swtest.org

or print a copy of the form and FAX it to the office by May 26, 2006. On site registration will be $615 and $745.

Program Highlights

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KEYNOTE ADDRESS

“Managing Subcontracted Testing” Mike Campbell, Vice President of Qualcomm, will discuss the excitement and challenges of managing production testing for the largest fabless semiconductor supplier in the world. He will describe the logistics of new product characterization and introduction, hardware deployment, test program revision control and crisis management, and the critical test data requirements for yield improvement and cost reductions.

TECHNICAL PROGRAM SESSIONS

Contact Resistance Control
Probe Productivity Improvements
High Power Probing
Reducing I/O Pad Damage
New Probe Technologies
Probe Potpourri
Future Trends
Probe “Year in Review”

The complete technical program with presentation times, titles, and presenters is on our web site: www.swtest.org.

PANEL DISCUSSION

“Probe Card Metrology” Eight of the world’s manufacturing probe experts will discuss their companies metrology systems, cleaning frequency and methods, identification criteria for defective cards, repair procedures, and their biggest concerns for the future. Panel members will represent AMD, Freescale, IBM, Infineon, Intel, Micron, Philips, and Texas Instruments.

EXHIBITS

Thirty-three of the top probe card, probe equipment, and related service suppliers will exhibit their latest products. The exhibit area will only be open when the technical program is not in session, for two hours on Sunday, Monday, and Tuesday late afternoons. It’s the only conference where the top probe suppliers are in one place at one time.

SOCIAL ACTIVITIES

The SWTW is a probe technology forum held in at a beautiful resort hotel setting with time dedicated for informal discussions and networking. Our special social activity will be a private dinner and tour at the San Diego Aerospace Museum in Balboa Park. Busses will depart from the hotel at 6:00 PM Monday and return attendees by 10:00 PM.

Hotel Information

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Hotel reservations must be made separately. Contact the Paradise Point Resort and Spa at (800) 344-2626 or +1.858.274.4630. We have a limited number of rooms reserved, so mention the Southwest Test Workshop, or our Group ID 84B94V, to get a discount rate of $179 per night. Contact the SWTW office at +1.540.937.5066 for alternate hotels.

For more information, visit us on the web at: http://www.swtest.org

The Southwest Test Workshop (SWTW 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).